Scanning X-ray nanodiffraction: from the experimental approach towards spatially resolved scattering simulations
نویسندگان
چکیده
: An enhancement on the method of X-ray diffraction simulations for applications using nanofocused hard X-ray beams is presented. We combine finite element method, kinematical scattering calculations, and a spot profile of the X-ray beam to simulate the diffraction of definite parts of semiconductor nanostructures. The spot profile could be acquired experimentally by X-ray ptychography. Simulation results are discussed and compared with corresponding X-ray nanodiffraction experiments on single SiGe dots and dot molecules.
منابع مشابه
Scanning x-ray nanodiffraction on Dictyostelium discoideum.
We have performed scanning x-ray nanobeam diffraction experiments on single cells of the amoeba Dictyostelium discoideum. Cells have been investigated in 1), freeze-dried, 2), frozen-hydrated (vitrified), and 3), initially alive states. The spatially resolved small-angle x-ray scattering signal shows characteristic streaklike patterns in reciprocal space, which we attribute to fiber bundles of ...
متن کاملSpatially confined low-power optically pumped ultrafast synchrotron x-ray nanodiffraction.
The combination of ultrafast optical excitation and time-resolved synchrotron x-ray nanodiffraction provides unique insight into the photoinduced dynamics of materials, with the spatial resolution required to probe individual nanostructures or small volumes within heterogeneous materials. Optically excited x-ray nanobeam experiments are challenging because the high total optical power required ...
متن کاملTotal-scattering pair-distribution function of organic material from powder electron diffraction data.
This paper shows that pair-distribution function (PDF) analyses can be carried out on organic and organometallic compounds from powder electron diffraction data. Different experimental setups are demonstrated, including selected area electron diffraction and nanodiffraction in transmission electron microscopy or nanodiffraction in scanning transmission electron microscopy modes. The methods wer...
متن کاملDetermining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution
We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-destructive and quantitative manner. We demonstrate that the method is sensitive enough to resolve co...
متن کاملMeasurement of structure factors by parallel and convergent beam electron nanodiffraction
A quantitative understanding of transmission electron microscopic (TEM) images usually involves simulations as a central part. In the TEM community, the Bloch wave approach is frequently applied to simulate diffracted beam amplitudes in crystalline specimen. For example, the CELFA [1] technique compares the composition-dependent contrast in experimental (200) lattice fringe images with Bloch wa...
متن کامل